Elevating 3D characterization with enhanced performance and efficiencies

Today, ZEISS launches its latest innovation in the field of X-ray microscopy: ZEISS VersaXRM 730®. The new system offers researchers an unprecedented level of performance, choice, and accessibility. 

As technology continues to evolve at a rapid pace, it is essential for researchers to have access to cutting-edge capabilities that can keep up with the changing landscape. ZEISS VersaXRM 730 is designed to meet these dynamic requirements, offering breakthrough resolution performance as well as faster throughput and time-to-results to accelerate productivity. The platform’s intuitive guidance and control system, the award-winning ZEN navx™, takes accessibility to the next level, accommodating users of all skill levels. FAST Mode delivers one-minute tomographies, dramatically accelerating 3D imaging by using continuous sample motion data collection. 

You can find further information here.